In-SEM solution
The broad ion beam sits inside the SEM main chamber, so preparation happens where the measurement does. No separate polishing station, no repeated transfers.
ScionTech integrates a broad ion beam directly into the SEM main chamber, so EBSD sample preparation and measurement happen in one place, with immediate feedback at every step.
Samples are prepared outside the microscope, so pattern quality is only known after transfer and pump-down. When the result is poor, the whole cycle starts over.
The broad ion beam sits inside the SEM main chamber, so preparation happens where the measurement does. No separate polishing station, no repeated transfers.
Designed to slot into the EBSD workflows your lab already runs. Keep your detector, your software and your routine, and add a preparation step that fits in.
See how preparation affects pattern quality as it happens. Adjust, re-measure and converge on the result with real data instead of guesswork.
Mount the sample in the SEM as usual. It stays there for the whole process.
The integrated broad ion beam removes surface damage directly in the main chamber.
Acquire EBSD patterns immediately on the freshly prepared surface.
Use the feedback to adjust and repeat until the data meets your standard.
Co-founder
Co-founder
Investor, partner or lab interested in a pilot? We'd like to hear from you.